![Forenzní věda]({"xsmall":"https://www.zeiss.cz/content/dam/iqs/r/industries/medical/forensics/zeiss_medical-forensic_teaser.jpg/_jcr_content/renditions/original.image_file.100.33.0,243,1601,777.file/zeiss_medical-forensic_teaser.jpg","small":"https://www.zeiss.cz/content/dam/iqs/r/industries/medical/forensics/zeiss_medical-forensic_teaser.jpg/_jcr_content/renditions/original.image_file.360.120.0,243,1601,777.file/zeiss_medical-forensic_teaser.jpg","medium":"https://www.zeiss.cz/content/dam/iqs/r/industries/medical/forensics/zeiss_medical-forensic_teaser.jpg/_jcr_content/renditions/original.image_file.768.256.0,243,1601,777.file/zeiss_medical-forensic_teaser.jpg","large":"https://www.zeiss.cz/content/dam/iqs/r/industries/medical/forensics/zeiss_medical-forensic_teaser.jpg/_jcr_content/renditions/original.image_file.1024.341.0,243,1601,777.file/zeiss_medical-forensic_teaser.jpg","xlarge":"https://www.zeiss.cz/content/dam/iqs/r/industries/medical/forensics/zeiss_medical-forensic_teaser.jpg/_jcr_content/renditions/original.image_file.1280.427.0,243,1601,777.file/zeiss_medical-forensic_teaser.jpg","xxlarge":"https://www.zeiss.cz/content/dam/iqs/r/industries/medical/forensics/zeiss_medical-forensic_teaser.jpg/_jcr_content/renditions/original.image_file.1440.480.0,243,1601,777.file/zeiss_medical-forensic_teaser.jpg","max":"https://www.zeiss.cz/content/dam/iqs/r/industries/medical/forensics/zeiss_medical-forensic_teaser.jpg/_jcr_content/renditions/original.image_file.1601.534.0,243,1601,777.file/zeiss_medical-forensic_teaser.jpg"} "Forenzní věda")
Soudní lékařství – Technologie pro vyšetřování místa činu a nehod
Metrologie pro oblast vyšetřování
Ve forenzní vědě vyšetřovatelé a vědci analyzují vzorky, otisky a stopy zajištěné na místech činu a u jednotlivých osob definovaným a logickým způsobem a zjištěné poznatky zaznamenávají. Analýza těchto vzorků umožňuje vědcům podat zprávu o faktech nebo jejich závěrech o nalezených důkazech ve vztahu k naznačenému průběhu událostí. Tato důkazní zjištění a související zprávy mohou být předloženy soudům, kde se rozhoduje o vině či nevině. Forenzní věda je rozsáhlá disciplína, která může zahrnovat zkoumání od jednoduché vizuální kontroly pomocí mikroskopů až po složité manuální nebo automatizované procesy s interpretací výsledků analýz.
ZEISS nabízí hardwarová a softwarová řešení, která podporují vyšetřování trestných činů a nehod.
![Optické měření kostí v soudním lékařství]({"xsmall":"https://www.zeiss.cz/content/dam/iqs/r/industries/medical/forensics/zeiss_forensic-bone.jpg/_jcr_content/renditions/original.image_file.100.75.240,0,1680,1080.file/zeiss_forensic-bone.jpg","small":"https://www.zeiss.cz/content/dam/iqs/r/industries/medical/forensics/zeiss_forensic-bone.jpg/_jcr_content/renditions/original.image_file.360.270.240,0,1680,1080.file/zeiss_forensic-bone.jpg","medium":"https://www.zeiss.cz/content/dam/iqs/r/industries/medical/forensics/zeiss_forensic-bone.jpg/_jcr_content/renditions/original.image_file.768.576.240,0,1680,1080.file/zeiss_forensic-bone.jpg","large":"https://www.zeiss.cz/content/dam/iqs/r/industries/medical/forensics/zeiss_forensic-bone.jpg/_jcr_content/renditions/original.image_file.1024.768.240,0,1680,1080.file/zeiss_forensic-bone.jpg","xlarge":"https://www.zeiss.cz/content/dam/iqs/r/industries/medical/forensics/zeiss_forensic-bone.jpg/_jcr_content/renditions/original.image_file.1280.960.240,0,1680,1080.file/zeiss_forensic-bone.jpg","xxlarge":"https://www.zeiss.cz/content/dam/iqs/r/industries/medical/forensics/zeiss_forensic-bone.jpg/_jcr_content/renditions/original.image_file.1440.1080.240,0,1680,1080.file/zeiss_forensic-bone.jpg","max":"https://www.zeiss.cz/content/dam/iqs/r/industries/medical/forensics/zeiss_forensic-bone.jpg/_jcr_content/renditions/original.image_file.1440.1080.240,0,1680,1080.file/zeiss_forensic-bone.jpg"})
Optická měřicí technika pro vyšetřování
3D technologie pro vyšetřování trestných činů a nehod
![Nábojnice pod mikroskopem pro forenzní analýzy]({"xsmall":"https://www.zeiss.cz/content/dam/iqs/r/industries/medical/forensics/zeiss_edf_projectile_axio-zoommat_1.jpg/_jcr_content/renditions/original.image_file.100.75.2,0,1919,1438.file/zeiss_edf_projectile_axio-zoommat_1.jpg","small":"https://www.zeiss.cz/content/dam/iqs/r/industries/medical/forensics/zeiss_edf_projectile_axio-zoommat_1.jpg/_jcr_content/renditions/original.image_file.360.270.2,0,1919,1438.file/zeiss_edf_projectile_axio-zoommat_1.jpg","medium":"https://www.zeiss.cz/content/dam/iqs/r/industries/medical/forensics/zeiss_edf_projectile_axio-zoommat_1.jpg/_jcr_content/renditions/original.image_file.768.576.2,0,1919,1438.file/zeiss_edf_projectile_axio-zoommat_1.jpg","large":"https://www.zeiss.cz/content/dam/iqs/r/industries/medical/forensics/zeiss_edf_projectile_axio-zoommat_1.jpg/_jcr_content/renditions/original.image_file.1024.768.2,0,1919,1438.file/zeiss_edf_projectile_axio-zoommat_1.jpg","xlarge":"https://www.zeiss.cz/content/dam/iqs/r/industries/medical/forensics/zeiss_edf_projectile_axio-zoommat_1.jpg/_jcr_content/renditions/original.image_file.1280.960.2,0,1919,1438.file/zeiss_edf_projectile_axio-zoommat_1.jpg","xxlarge":"https://www.zeiss.cz/content/dam/iqs/r/industries/medical/forensics/zeiss_edf_projectile_axio-zoommat_1.jpg/_jcr_content/renditions/original.image_file.1440.1080.2,0,1919,1438.file/zeiss_edf_projectile_axio-zoommat_1.jpg","max":"https://www.zeiss.cz/content/dam/iqs/r/industries/medical/forensics/zeiss_edf_projectile_axio-zoommat_1.jpg/_jcr_content/renditions/original.image_file.1917.1438.2,0,1919,1438.file/zeiss_edf_projectile_axio-zoommat_1.jpg"})
Balistické a stopové zkoušky
Analýza vlivu namáhání na povrch materiáluZjistěte více o tom, jak světelný a elektronový mikroskop může pomoci při vyšetřování a analýze nástrojů použitých na místě činu.
![]({"xsmall":"https://www.zeiss.cz/content/dam/iqs/r/systems/industrial-microscopy/ims_stage-connected_web.jpg/_jcr_content/renditions/original.image_file.100.100.729,0,1809,1080.file/ims_stage-connected_web.jpg","small":"https://www.zeiss.cz/content/dam/iqs/r/systems/industrial-microscopy/ims_stage-connected_web.jpg/_jcr_content/renditions/original.image_file.360.360.729,0,1809,1080.file/ims_stage-connected_web.jpg","medium":"https://www.zeiss.cz/content/dam/iqs/r/systems/industrial-microscopy/ims_stage-connected_web.jpg/_jcr_content/renditions/original.image_file.768.768.729,0,1809,1080.file/ims_stage-connected_web.jpg","large":"https://www.zeiss.cz/content/dam/iqs/r/systems/industrial-microscopy/ims_stage-connected_web.jpg/_jcr_content/renditions/original.image_file.1024.1024.729,0,1809,1080.file/ims_stage-connected_web.jpg","xlarge":"https://www.zeiss.cz/content/dam/iqs/r/systems/industrial-microscopy/ims_stage-connected_web.jpg/_jcr_content/renditions/original.image_file.1080.1080.729,0,1809,1080.file/ims_stage-connected_web.jpg","xxlarge":"https://www.zeiss.cz/content/dam/iqs/r/systems/industrial-microscopy/ims_stage-connected_web.jpg/_jcr_content/renditions/original.image_file.1080.1080.729,0,1809,1080.file/ims_stage-connected_web.jpg","max":"https://www.zeiss.cz/content/dam/iqs/r/systems/industrial-microscopy/ims_stage-connected_web.jpg/_jcr_content/renditions/original.image_file.1080.1080.729,0,1809,1080.file/ims_stage-connected_web.jpg"})
![ATOS]({"xsmall":"https://www.zeiss.cz/content/dam/iqs/r/systems/optical-3d/3d-scanning/atos/atos-5x/zeiss_atos5.jpg/_jcr_content/renditions/original.image_file.100.100.420,0,1500,1080.file/zeiss_atos5.jpg","small":"https://www.zeiss.cz/content/dam/iqs/r/systems/optical-3d/3d-scanning/atos/atos-5x/zeiss_atos5.jpg/_jcr_content/renditions/original.image_file.360.360.420,0,1500,1080.file/zeiss_atos5.jpg","medium":"https://www.zeiss.cz/content/dam/iqs/r/systems/optical-3d/3d-scanning/atos/atos-5x/zeiss_atos5.jpg/_jcr_content/renditions/original.image_file.768.768.420,0,1500,1080.file/zeiss_atos5.jpg","large":"https://www.zeiss.cz/content/dam/iqs/r/systems/optical-3d/3d-scanning/atos/atos-5x/zeiss_atos5.jpg/_jcr_content/renditions/original.image_file.1024.1024.420,0,1500,1080.file/zeiss_atos5.jpg","xlarge":"https://www.zeiss.cz/content/dam/iqs/r/systems/optical-3d/3d-scanning/atos/atos-5x/zeiss_atos5.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/zeiss_atos5.jpg","xxlarge":"https://www.zeiss.cz/content/dam/iqs/r/systems/optical-3d/3d-scanning/atos/atos-5x/zeiss_atos5.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/zeiss_atos5.jpg","max":"https://www.zeiss.cz/content/dam/iqs/r/systems/optical-3d/3d-scanning/atos/atos-5x/zeiss_atos5.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/zeiss_atos5.jpg"} "ATOS")
![]({"xsmall":"https://www.zeiss.cz/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/crossbeam/crossbeam_links.png/_jcr_content/renditions/original.image_file.100.100.384,0,1536,1152.file/crossbeam_links.png","small":"https://www.zeiss.cz/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/crossbeam/crossbeam_links.png/_jcr_content/renditions/original.image_file.360.360.384,0,1536,1152.file/crossbeam_links.png","medium":"https://www.zeiss.cz/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/crossbeam/crossbeam_links.png/_jcr_content/renditions/original.image_file.768.768.384,0,1536,1152.file/crossbeam_links.png","large":"https://www.zeiss.cz/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/crossbeam/crossbeam_links.png/_jcr_content/renditions/original.image_file.1024.1024.384,0,1536,1152.file/crossbeam_links.png","xlarge":"https://www.zeiss.cz/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/crossbeam/crossbeam_links.png/_jcr_content/renditions/original.image_file.1152.1152.384,0,1536,1152.file/crossbeam_links.png","xxlarge":"https://www.zeiss.cz/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/crossbeam/crossbeam_links.png/_jcr_content/renditions/original.image_file.1152.1152.384,0,1536,1152.file/crossbeam_links.png","max":"https://www.zeiss.cz/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/crossbeam/crossbeam_links.png/_jcr_content/renditions/original.image_file.1152.1152.384,0,1536,1152.file/crossbeam_links.png"})
![]({"xsmall":"https://www.zeiss.cz/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/evo/evo_links.png/_jcr_content/renditions/original.image_file.100.100.474,117,1407,1050.file/evo_links.png","small":"https://www.zeiss.cz/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/evo/evo_links.png/_jcr_content/renditions/original.image_file.360.360.474,117,1407,1050.file/evo_links.png","medium":"https://www.zeiss.cz/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/evo/evo_links.png/_jcr_content/renditions/original.image_file.768.768.474,117,1407,1050.file/evo_links.png","large":"https://www.zeiss.cz/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/evo/evo_links.png/_jcr_content/renditions/original.image_file.933.933.474,117,1407,1050.file/evo_links.png","xlarge":"https://www.zeiss.cz/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/evo/evo_links.png/_jcr_content/renditions/original.image_file.933.933.474,117,1407,1050.file/evo_links.png","xxlarge":"https://www.zeiss.cz/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/evo/evo_links.png/_jcr_content/renditions/original.image_file.933.933.474,117,1407,1050.file/evo_links.png","max":"https://www.zeiss.cz/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/evo/evo_links.png/_jcr_content/renditions/original.image_file.933.933.474,117,1407,1050.file/evo_links.png"})
![]({"xsmall":"https://www.zeiss.cz/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/geminisem/gemini-links.png/_jcr_content/renditions/original.image_file.100.100.384,0,1536,1152.file/gemini-links.png","small":"https://www.zeiss.cz/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/geminisem/gemini-links.png/_jcr_content/renditions/original.image_file.360.360.384,0,1536,1152.file/gemini-links.png","medium":"https://www.zeiss.cz/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/geminisem/gemini-links.png/_jcr_content/renditions/original.image_file.768.768.384,0,1536,1152.file/gemini-links.png","large":"https://www.zeiss.cz/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/geminisem/gemini-links.png/_jcr_content/renditions/original.image_file.1024.1024.384,0,1536,1152.file/gemini-links.png","xlarge":"https://www.zeiss.cz/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/geminisem/gemini-links.png/_jcr_content/renditions/original.image_file.1152.1152.384,0,1536,1152.file/gemini-links.png","xxlarge":"https://www.zeiss.cz/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/geminisem/gemini-links.png/_jcr_content/renditions/original.image_file.1152.1152.384,0,1536,1152.file/gemini-links.png","max":"https://www.zeiss.cz/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/geminisem/gemini-links.png/_jcr_content/renditions/original.image_file.1152.1152.384,0,1536,1152.file/gemini-links.png"})
![]({"xsmall":"https://www.zeiss.cz/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/sigma/sigma_links.png/_jcr_content/renditions/original.image_file.100.100.456,125,1412,1081.file/sigma_links.png","small":"https://www.zeiss.cz/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/sigma/sigma_links.png/_jcr_content/renditions/original.image_file.360.360.456,125,1412,1081.file/sigma_links.png","medium":"https://www.zeiss.cz/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/sigma/sigma_links.png/_jcr_content/renditions/original.image_file.768.768.456,125,1412,1081.file/sigma_links.png","large":"https://www.zeiss.cz/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/sigma/sigma_links.png/_jcr_content/renditions/original.image_file.956.956.456,125,1412,1081.file/sigma_links.png","xlarge":"https://www.zeiss.cz/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/sigma/sigma_links.png/_jcr_content/renditions/original.image_file.956.956.456,125,1412,1081.file/sigma_links.png","xxlarge":"https://www.zeiss.cz/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/sigma/sigma_links.png/_jcr_content/renditions/original.image_file.956.956.456,125,1412,1081.file/sigma_links.png","max":"https://www.zeiss.cz/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/sigma/sigma_links.png/_jcr_content/renditions/original.image_file.956.956.456,125,1412,1081.file/sigma_links.png"})