Všestranný elektronový mikroskop s intuitivním ovládáním poskytující kvalitní data
Mikroskopy řady ZEISS EVO kombinují vysoce výkonnou rastrovací elektronovou mikroskopii s intuitivním a uživatelsky přívětivým ovládáním, které osloví jak odborníky, tak i nové uživatele. Díky rozsáhlým možnostem lze ZEISS EVO přesně přizpůsobit vašim požadavkům, ať se zabýváte materiálovými vědami nebo rutinním průmyslovým zajišťováním kvality a analýzou poruch.
ZEISS EVO je konvenční základní systém s wolframovým nebo LaB6 filamentem pro každodenní opakovatelné zobrazovací úlohy, např. analýzu materiálů s vysokým rozlišením, s převážně automatizovanými a podpůrnými pracovními postupy. Systém nabízí flexibilitu pro méně náročné velikosti struktur.
Oblasti použití
Analýza a kontrola kvality
Analýza poruch a fraktografie
Materiálografie
Kontrola čistoty
Morfologická a chemická analýza částic dle norem ISO 16232 a VDA 19 část 1 a 2
Analýza nekovových vměstků
ZEISS EVO: Všestranný elektronový mikroskop s intuitivním ovládáním poskytující kvalitní data
Posuňte kontrolu na vyšší úroveň. ZEISS EVO vám nabízí možnosti konfigurace, které přesně splní vaše požadavky na cenu a výkon. Přizpůsobte si požadované rozlišení vaší aplikaci a vyberte si ze tří velikostí komory.
Můžete si také zvolit vysoké vakuum, proměnný tlak nebo okolní tlak, aby vyhovovaly typu vašeho vzorku. Poté si zvolte některý z detektorů SE, BSE, EDS, VP a C2D, který bude vyhovovat vaší aplikaci. S mikroskopem ZEISS EVO získáte výhody elektronové mikroskopie za dostupnou cenu.
Příklady použití
Elektronika
Na povrchu integrovaného obvodu jsou patrné nečistoty a kontaminace. Zobrazeno detektorem SE ve vysokém vakuu při 10 kV.
Palivové články
Palivové články se obvykle skládají z polymerních elektrolytických membrán vložených mezi platinové elektrody. Tyto kritické komponenty je třeba zobrazovat při nízkém napětí, aby se získaly informace o detailech povrchu ve vysokém rozlišení. Průřez se zdrojem LaB6 (vlevo) a wolframovým zdrojem (vpravo) při 3 kV. Zdroj LaB6 poskytuje více detailů povrchu při nízkých urychlovacích napětích.
Pozinkovaná nízkouhlíková ocel
Průřez pozinkovanou nízkouhlíkovou ocelí, zobrazený pomocí detektoru SE na objektivu ZEISS EVO 15. Vlevo: montážní pryskyřice; uprostřed: vrstva zinku; vpravo: nízkouhlíková ocel.
Analýza materiálu pomocí rentgenové spektroskopie (EDS)
BSE snímky reprezentativních zkorodovaných povrchů s EDS mapou: chrom, olovo, měď, nikl, karbon a kyslík.
Analýza poruchy na povrchu kuličkového ložiska
Povrch kuličkového ložiska zobrazený detektorem BSE ukazuje praskání a odlupování povrchové struktury.
Technická čistota
Částice z filtru částic: analýza technické čistoty a kontrola kvality.
Rastrovací elektronový mikroskop ZEISS EVO – 10 hlavních bodů za 90 sekund
Blokovaný obsah třetí strany
Video přehrávač je zablokován kvůli vaším předvolbám souborů cookie. Pro změnu nastavení a přehrátí videozáznamu klikněte na níže uvedené tlačítko a vyslovte svůj souhlas s použitím „funkčních“ sledovacích technologií.
Zjistěte, jak vám skenovací elektronový mikroskop ZEISS EVO pomůže s rutinní kontrolou a analýzou poruch v laboratořích kvality a materiálů tím, že umožňuje intuitivní zobrazování i začínajícím uživatelům. Funkce EVO: - Zobrazování s vysokým rozlišením - Efektivní provoz - Analýza chemického složení - Velké obrobky - Pořizování snímků velkých ploch - Nevodivé vzorky - EDS analýza částic - Automatizovaná měření - Inteligentní segmentace obrazu - Korelace a sdílení obrazu
Další aplikace pro průmysl:
Fázová, částicová a svarová analýza
Vizuální kontrola elektronických součástek, integrovaných obvodů, zařízení MEMS a solárních článků
Výzkum povrchu měděných drátů a krystalové struktury
Výzkum koroze kovů
Analýza intermetalických fází a fázových přechodů
Zobrazování a analýza mikrotrhlin a lomové pevnosti
Výzkum povlaků a kompozitních materiálů
Zkoumání svarových švů a tepelně ovlivněných zón
Vždy když je třeba, pomůže nám ZEISS EVO najít jehlu v kupce sena.
Hledání jehly v kupce sena.
Technická čistota: Skupina INNIO analyzuje chemické složení zbytkových nečistot pomocí roztoku ZEISS,
Blokovaný obsah třetí strany
Video přehrávač je zablokován kvůli vaším předvolbám souborů cookie. Pro změnu nastavení a přehrátí videozáznamu klikněte na níže uvedené tlačítko a vyslovte svůj souhlas s použitím „funkčních“ sledovacích technologií.
Přesné a spolehlivé výsledky jsou samozřejmě důležité, ale je také třeba je získat rychle.
Mikroskopické aplikace pro zajištění kvality:
Příklady zákazníků, brožura zkušenosti z průmyslu
ZEISS IQS, Mic and TCA, Success Story, INNIO Group, EN, PDF
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