Workshop | Correlative Microscopy
Applications and Trends
Cancelled as a Coronavirus precautionary measure. We apologize for any inconvenience.
Why Correlative Microscopy?
Comprehensive images. Extended capacity, speed and precision. Understanding your sample on multiple levels.That and more is exactly why Correlative Microscopy is gaining traction. The combination of multiple contrasting techniques and technologies – ZEISS or not – allows you to get insight on your research questions from more angles. No matter if you want to understand synaptic ultrastructure in context with a brain region, or want to determine which particles are critical for the technical cleanliness of your processes.
Join this workshop in our new ZEISS Customer Center in Prague to learn about the possibilities, trends and discuss the right solution for you.
The workshop will be lead by Application Specialists Dr. Herbert Pavlicek and Dr. Nicolas Gueninchault along with Ing. Andrej Mazán, the Director of CZ&SK ZEISS Microscopy.
Program
10:00 |
Introduction & Contest Announcement |
Ing. Andrej Mazán, MBA |
10:15 |
Electron Microscopy: Acquire EM Images Easier and Faster |
Dr. Herbert Pavlicek |
11:15 |
Lunch |
|
12:15 |
X-ray Microscopy: Use X-ray Data to Localize |
Dr. Nicolas Gueninchault |
13:15 |
EM + XRM: A Sample-centric Combination |
Joint Presentation |
14:00 |
Coffee Break |
|
14:15 |
Discussion: Master Your Multi-scale Challenge |
Panel Discussion |
14:45 |
Conclusion & Contest Winner |
|
Location & Direction
Contact
Radlicka 14/3201
150 00 Praha
+420 233 101 234
Direction
Metro B: Andel
Tram: Andel, Na Knizeci
Bus: Andel, Na Knizeci
Registration
Unfortunately, the workshop has been cancelled due to the current Coronavirus situation. The event will be postponed to another date.
We apologize for any inconvenience caused.