Workshop | Correlative Microscopy

Applications and Trends

CANCELLED ZEISS Customer Center Prague

Cancelled as a Coronavirus precautionary measure. We apologize for any inconvenience.

Why Correlative Microscopy?

Comprehensive images. Extended capacity, speed and precision. Understanding your sample on multiple levels.

That and more is exactly why Correlative Microscopy is gaining traction. The combination of multiple contrasting techniques and technologies – ZEISS or not – allows you to get insight on your research questions from more angles. No matter if you want to understand synaptic ultrastructure in context with a brain region, or want to determine which particles are critical for the technical cleanliness of your processes.

Join this workshop in our new ZEISS Customer Center in Prague to learn about the possibilities, trends and discuss the right solution for you.

The workshop will be lead by Application Specialists Dr. Herbert Pavlicek and Dr. Nicolas Gueninchault along with Ing. Andrej Mazán, the Director of CZ&SK ZEISS Microscopy.

Program

10:00

Introduction & Contest Announcement

Ing. Andrej Mazán, MBA

10:15

Electron Microscopy: Acquire EM Images Easier and Faster

Dr. Herbert Pavlicek

11:15

Lunch

 

12:15

X-ray Microscopy: Use X-ray Data to Localize

Dr. Nicolas Gueninchault

13:15

EM + XRM: A Sample-centric Combination

Joint Presentation

14:00

Coffee Break

 

14:15

Discussion: Master Your Multi-scale Challenge

Panel Discussion

14:45

Conclusion & Contest Winner

 

Location & Direction

ZEISS Customer Center Prague

Radlicka 14/3201

150 00 Praha

+420 233 101 234

Directions

Contact

Radlicka 14/3201

150 00 Praha

+420 233 101 234

 

Direction

Metro B: Andel

Tram: Andel, Na Knizeci

Bus: Andel, Na Knizeci

Registration

Unfortunately, the workshop has been cancelled due to the current Coronavirus situation. The event will be postponed to another date.

We apologize for any inconvenience caused.